Publications

Correlation between Co-60 and x-ray exposures on radiation-induced charge buildup in silicon-on-insulator buried oxides

Schwank, James R.; Shaneyfelt, Marty R.; Jones, Rhonda L.; Draper, Bruce L.; Dodd, Paul E.; Witczak, Steven C.; Riewe, Leonard C.

Large differences in charge buildup in SOI buried oxides can result between x-ray and Co-60 irradiations. The effects of bias configuration and substrate type on charge buildup and hardness assurance issues are explored.