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Comparison of High and Low Flux He Exposures on the Gain Degradation and Defect Spectra in Si pnp BJTs

Aguirre, Brandon A.; Vaandrager, Bastiaan L.; Vizkelethy, Gyorgy V.; Martin, William J.; Seidl, P.S.; Persaud, A.P.; Ji, Q.J.; Ludewigt, B.A.; Schenkel, T.S.; Bielejec, Edward S.

Abstract not provided.