Characterization of Novel Nanoscale Device Architectures using Current Mapping AFM
Howell, Stephen W.; Marinella, Matthew J.; Siegal, Michael P.; Friedman, Caitlin R.; Decker, Seth D.; Hughart, David R.; Yelton, William G.; Beechem, Thomas E.; Davids, Paul D.; Bogart, Gregory R.; Dirk, Shawn M.
Abstract not provided.