Characterization and Impact of Atomic Imperfections in Si:P Materials and Devices
Schmucker, Scott W.; Anderson, Evan M.; Lucero, Joe A.; Bussmann, Ezra B.; Lu, Ping L.; Katzenmeyer, Aaron M.; Luk, Ting S.; Beechem, Thomas E.; Tracy, Lisa A.; Lu, Tzu-Ming L.; Grine, Albert D.; Ward, Daniel R.; Campbell, DeAnna M.; Gamache, Phillip G.; Gunter, Mathew M.; Misra, Shashank M.
Abstract not provided.