Publications

Arc fault risk assessment and degradation model development for photovoltaic connectors

Yang, Benjamin B.; Armijo, Kenneth M.; Harrison, Richard K.; Thomas, Kara E.; Johnson, Jay; Taylor, Jason M.; Sorensen, Neil R.

This work investigates balance of systems (BOS) connector reliability from the perspective of arc fault risk. Accelerated tests were performed on connectors for future development of a reliability model. Thousands of hours of damp heat and atmospheric corrosion tests found BOS connectors to be resilient to corrosion-related degradation. A procedure was also developed to evaluate new and aged connectors for arc fault risk. The measurements show that arc fault risk is dependent on a combination of materials composition as well as design geometry. Thermal measurements as well as optical emission spectroscopy were also performed to further characterize the arc plasma. Together, the degradation model, arc fault risk assessment technique, and characterization methods can provide operators of photovoltaic installations information necessary to develop a data-driven plan for BOS connector maintenance as well as identify opportunities for arc fault prognostics.