Analysis of TID Process Geometry and Bias Condition Dependence of 14-nm FinFETs and Implications for RF and SRAM Performance
King, Michael P.; Wu, X.Q.; Eller, M.E.; Samavedam, S.S.; Shaneyfelt, Marty R.; Silva, Antoinette I.; Draper, Bruce L.; Rice, William C.; Meisenheimer, Timothy L.; Zhang, E.Z.; Haeffner, T.D.; Ball, D.R.; Shetler, K.J.; Alles, M.L.; Kauppila, J.S.; Massengill, Lloyd W.
Abstract not provided.