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Ambient Temperature Thermally Induced Voltage Alteration (TIVA) for Identification of Defects in Superconducting Electronics

Jenkins, Mark W.; Tangyunyong, Paiboon T.; Missert, Nancy A.; vernik, igor v.; Kirichhenko, Alex K.; Mukhanov, Oleg M.; Wynn, Alex W.; Bolkhovsky, Vladimir B.; Johnson, Leonard J.

Abstract not provided.