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A Theory for RF and Microwave Scalar Reflectometers

Moyer, Robert D.; Moyer, Robert D.

A careful analysis of rf and microwave scalar reflectometers is conducted to (1) reveal the advantages of 4-port over 3-port reflectometers, (2) show the advantage--and remaining weaknesses--of a reflectometer initialized by the open/short method and (3) present expressions for the worst-case errors in scalar reflectometer measurements.