Publications

Solution-verified reliability analysis and design of bistable MEMS using error estimation and adaptivity

Adams, Brian M.; Wittwer, Jonathan W.; Bichon, Barron J.; Carnes, Brian C.; Copps, Kevin D.; Eldred, Michael S.; Hopkins, Matthew M.; Neckels, David C.; Notz, Patrick N.; Subia, Samuel R.

This report documents the results for an FY06 ASC Algorithms Level 2 milestone combining error estimation and adaptivity, uncertainty quantification, and probabilistic design capabilities applied to the analysis and design of bistable MEMS. Through the use of error estimation and adaptive mesh refinement, solution verification can be performed in an automated and parameter-adaptive manner. The resulting uncertainty analysis and probabilistic design studies are shown to be more accurate, efficient, reliable, and convenient.