Publications

Multiscale Modeling of Single Event-Induced Faults in FinFET-based Processors

Cannon, Matthew J.; Rodrigues, Arun; Black, Dolores A.; Black, Jeffrey B.; Bustamante, Luis G.; Feinberg, Benjamin F.; Clark, L.; Brunhaver, John B.; Barnaby, Hugh B.; Agarwal, Sapan A.; Marinella, Matthew J.

Abstract not provided.