Microwave Based Lifetime Measurements and Analysis for Detector Materials
Shaner, Eric A.; Kadlec, Clark N.; Goldflam, Michael G.; Bielejec, Edward S.; Webster, Preston T.; Anderson, Evan M.; Hawkins, Samuel D.; Olson, Ben O.; Kadlec, Emil A.; Kim, Jin K.; Schultz, Peter A.; Tauke-Pedretti, Anna; Coon, Wesley T.; Fortune, Torben R.; Klem, John F.
Abstract not provided.